X-ray diffraction reveals the amount of strain and homogeneity of extremely bent single nanowires
نویسندگان
چکیده
منابع مشابه
comparison of the amount of debris extruded apically in two rotary techniques: flexmaster and m2
چکیده ندارد.
15 صفحه اولHigh-resolution X-ray diffraction analysis of strain distribution in GaN nanowires on Si(111) substrate
In this work, the influence of micro- and macro-deformation profiles in GaN nanowires (NWs) on the angular intensity distribution of X-ray diffraction are studied theoretically. The calculations are performed by using kinematical theory of X-ray diffraction and assuming the deformation decays exponentially from the NW/substrate interface. Theoretical modeling of X-ray scattering from NWs with d...
متن کاملGrazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams
Grazing-incidence X-ray diffraction measurements on single GaAs nanowires (NWs) grown on a (111)-oriented GaAs substrate by molecular beam epitaxy are reported. The positions of the NWs are intentionally determined by a direct implantation of Au with focused ion beams. This controlled arrangement in combination with a nanofocused X-ray beam allows the in-plane lattice parameter of single NWs to...
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the major purpose of this study was to develop the translation teacher competency test (ttct) and examine its construct and predictive validity. the present study was conducted in two phases: a qualitative phase as well as a quantitative phase. in the first phase of the study, the author attempted to find out the major areas of competency required for an academic translation teacher. the second...
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ژورنال
عنوان ژورنال: Journal of Applied Crystallography
سال: 2020
ISSN: 1600-5767
DOI: 10.1107/s1600576720011516